Are you looking quote for part 0P830WSL? The Optek Technology Inc-manufactured component (CAGE Code: 32694) is documented under NSN 5961-01-444-8076 as Semiconductor Devic. For the fastest quote, please complete our RFQ form with details about 0P830WSL. We guarantee a response within 15 minutes.
ASAP Components provides the verified 0P830WSL, classified under INC 20587, FSG 59 Electrical and Electronic Equipment Components, FSC 5961 Semiconductor Devices and Associated Hardware, NIIN 01-444-8076, and NCB 01. Submit your requirements today to receive immediate pricing and availability information.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-444-8076 Item PartTypeName: SEMICONDUCTOR DEVICE,PHOTO | 5961 | 014448076 | N | A | ||
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| A | A | 0 | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 0P830WSL | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 0.187 INCHES MINIMUM AND 0.202 INCHES MAXIMUM" |
| AKPV | MOUNTING FACILITY QUANTITY | 1" |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | TO-18" |
| AXGY | MOUNTING METHOD | UNTHREADED HOLE" |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON" |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 15.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN" |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 125.0 DEG CELSIUS AMBIENT AIR" |
| ABHP | OVERALL LENGTH | 0.187 INCHES MINIMUM AND 0.202 INCHES MAXIMUM" |
| AKPV | MOUNTING FACILITY QUANTITY | 1" |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | TO-18" |
| AXGY | MOUNTING METHOD | UNTHREADED HOLE" |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON" |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 15.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN" |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 125.0 DEG CELSIUS AMBIENT AIR" |
| End Use : 21320 | Semiconductors |
|---|---|
| Schedule B : 8541409500 (NAICS 334413) | Photosensitive semiconductor devices, nesoi |
| SITC : 77637 | Photosensitive semiconductor devices; light emitting diodes |
| ADPE | Represents items with no adp components |
|---|---|
| CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
| ESD | A - No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity. |
| HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
| PMIC | A - Item does not contain precious metal. |
