Are you looking quote for part 74HC154? The North American Philips Corp-manufactured component (CAGE Code: 0JN86) is documented under NSN 5962-01-516-2214 as Microcircuit Digita. For the fastest quote, please complete our RFQ form with details about 74HC154. We guarantee a response within 15 minutes.
ASAP Components provides the verified 74HC154, classified under INC 31779, FSG 59 Electrical and Electronic Equipment Components, FSC 5962 Microcircuits Electronic, NIIN 01-516-2214, and NCB 01. Submit your requirements today to receive immediate pricing and availability information.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-516-2214 Item PartTypeName: MICROCIRCUIT,DIGITAL | 5962 | 015162214 | N | A | ||
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| A | A | 0 | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 74HC154 | 5 | 9 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| CSSL | Design Function And Quantity | 2 FLIP-FLOP, J-K |
| CQZP | Input Circuit Pattern | 10 INPUT |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| MRC | Decoded Requirement | Clear Text Reply |
| CQSJ | Inclosure Material | CERAMIC |
| End Use : 21320 | Semiconductors |
|---|---|
| Schedule B : 8542900000 (NAICS 334413) | Electronic integrated circuits and microassembly parts |
| SITC : 77689 | Parts of electronic integrated circuits and microassembles |
| ADPE | Represents items with no adp components |
|---|---|
| CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
| ESD | A - No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity. |
| HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
| PMIC | A - Item does not contain precious metal. |
