Are you looking quote for part JAN1N3000B? The Military Specifications-manufactured component (CAGE Code: 81349) is documented under NSN 5961-00-849-4588 as Semiconductor Devic. For the fastest quote, please complete our RFQ form with details about JAN1N3000B. We guarantee a response within 15 minutes.
ASAP Components provides the verified JAN1N3000B, classified under INC 20589, FSG 59 Electrical and Electronic Equipment Components, FSC 5961 Semiconductor Devices and Associated Hardware, NIIN 00-849-4588, and NCB 00. Submit your requirements today to receive immediate pricing and availability information.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-00-849-4588 Item PartTypeName: SEMICONDUCTOR DEVICE,DIODE | 5961 | 008494588 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | U | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 174-22826-03 | 3 | 1 | C | A |
| MRC | Criteria | Characteristic |
|---|---|---|
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| AXGY | MOUNTING METHOD | THREADED STUD |
| CCDG | OVERALL WIDTH ACROSS FLATS | 0.423 INCHES MINIMUM AND 0.438 INCHES MAXIMUM |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 750.00 MILLIAMPERES MAXIMUM PEAK REVERSE SURGE CURRENT |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS CASE |
| MATT | MATERIAL | SILICON SEMICONDUCTOR |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 1 TAB,SOLDER LUG |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/124 GOVERNMENT SPECIFICATION |
| ABHP | OVERALL LENGTH | 0.300 INCHES MINIMUM AND 0.405 INCHES MAXIMUM |
| ALBA | ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | ANODE |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CQJX | NOMINAL THREAD SIZE | 0.190 INCHES |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 62.0 MAXIMUM NOMINAL REGULATOR VOLTAGE |
| CTRD | POWER RATING PER CHARACTERISTIC | 10.0 WATTS MAXIMUM TOTAL POWER DISSIPATION |
| TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| End Use : 21320 | Semiconductors |
|---|---|
| Schedule B : 8541100070 (NAICS 334413) | Diodes, other than photosensitve or led, with a current of 0.5 a or less |
| SITC : 77631 | Diodes, not photosensitive nor light emitting diodes |
| CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
|---|---|
| ESD | B - Represents items with esd sensitivity. |
| HMIC | N - Indicates there is no data in the hmirs and the nsn is in a fsc not generally suspected of containing hazardous materials. |
| PMIC | U - Precious metal content is unknown |
| AAC | Z |
|---|---|
| Classification Control | U |
| MGMT_CTL | Q2200x- |
| Quantity per pack | 1 |
| Repariability | This is a nonreparable item. if condemned or economically unserviceable, then dispose at the level authorized replace the item. |
| Shelf Life | N/A |
| SOS | Sms |
| Unit of Measure | Ea |
| ACC: | H - Instruments/equipment/supplies for radio, communications, electrical, laboratory, etc. (includes signal corps) |
|---|---|
| ADC: | A - Shipment is not a consolidation and does not exceed 84 inches in any dimension. |
| LTL: | W - Rating variable |
| NMFC: | 063025 - Semiconductors/devices noi etc |
| SHC: | 9 - Other or no special handling required (sh) |
| TCC: | Z - No special type of cargo code applicable |
| WCC: | 72D - Communications/electronics, other than sigint/ew or comsec repair parts and components |
