Are you looking quote for part A2X1197? The Fei Microwave Inc-manufactured component (CAGE Code: 21847) is documented under NSN 5961-01-184-8888 as Semiconductor Device Diode. For the fastest quote, please complete our RFQ form with details about A2X1197. We guarantee a response within 15 minutes.
ASAP Components provides the verified A2X1197, classified under INC 20589, FSG 59 Electrical and Electronic Equipment Components, FSC 5961 Semiconductor Devices and Associated Hardware, NIIN 01-184-8888, and NCB 01. Submit your requirements today to receive immediate pricing and availability information.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-184-8888 Item Description: SEMICONDUCTOR DEVICE,DIODE | 5961 | 011848888 | 0 | N | A | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | A | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| A2X1197 | 3 | 2 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | GLASS |
| ABHP | OVERALL LENGTH | 0.150 INCHES MINIMUM AND 0.170 INCHES UM |
| ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM AND 1.500 INCHES UM |
| ADAV | OVERALL DIAMETER | 0.068 INCHES MINIMUM AND 0.076 INCHES UM |
| AGAV | END ITEM IDENTIFICATION | B1B PACER BEE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 33.00 MILLIAMPERES FORWARD CURRENT |
| CTSG | UM OPERATING TEMP PER MEASUREMENT POINT | 125.0 DEG CELSIUS AMBIENT AIR |
| TEST | TEST DATA DOCUMENT | 00752-411646 DRAWING (THIS IS THE BASIC GOVERNING DRAWING |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
| AXGY | MOUNTING METHOD | TERMINAL |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 20.0 UM WORKING PEAK REVERSE VOLTAGE |
