Are you looking quote for part 9432 020 13121? The Fei Company-manufactured component (CAGE Code: 1FJ95) is documented under NSN 6640-01-526-8899 as Scanning Electron Micr Substrate. For the fastest quote, please complete our RFQ form with details about 9432 020 13121. We guarantee a response within 15 minutes.
ASAP Components provides the verified 9432 020 13121, classified under INC 51464, FSG 66 Instruments and Laboratory Equipment, FSC 6640 Laboratory Equipment And Supplies, NIIN 01-526-8899, and NCB 01. Submit your requirements today to receive immediate pricing and availability information.
| End Use : 21600 | Laboratory testing instruments |
|---|---|
| Schedule B : 9012900000 (NAICS 334516) | Parts and accessories for microscopes other than optical microscopes; diffraction apparatus |
| SITC : 87139 | Parts and accessories for microscopes (except optical) and diffraction apparatus |
| ADPE | Represents items with no adp components |
|---|---|
| CRITL | The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. |
| ESD | A - No known electrostatic discharge (esd) or electromagnetic interference (emi) sensitivity. |
| HMIC | P - Indicates there is no information in the hmirs. The nsn is in a fsc in table ii of federal standard 313 and a msds may be required by the user. The requirement for a msds is dependent on a hazard determination of the supplier or the intended end use of item. |
| PMIC | A - Item does not contain precious metal. |
